Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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27 results for R.J. Miller

Analysis of parasitic resistance in double gate FinFETs with different fin lengths
- - X. Yang
  - Kingsuk Maitra
  - et al.
- 2011
- IEEE International SOI Conference 2011
Sub-25nm FinFET with advanced fin formation and short channel effect engineering
- - Tenko Yamashita
  - Veeraraghvan S. Basker
  - et al.
- 2011
- VLSI Technology 2011
Opportunities and challenges of FinFET as a device structure candidate for 14nm node CMOS technology
- - Tenko Yamashita
  - Veeraraghvan S. Basker
  - et al.
- 2011
- CSTIC 2011
A 0.063 μm² FinFET SRAM cell demonstration with conventional lithography using a novel integration scheme with aggressively scaled fin and gate pitch
- - Veeraraghvan S. Basker
  - Theodorus E. Standaert
  - et al.
- 2010
- VLSI Technology 2010
New polysilicon disposable sidewall process for sub-50 nm CMOS
- - K.L. Lee
  - D. Boyd
  - et al.
- 2001
- ESSDERC 2001
High performance of planar double gate MOSFETs with thin backgate dielectrics
- - E.C. Jones
  - M. Ieong
  - et al.
- 2001
- DRC 2001
Surface cleaning by electrostatic removal of particles
- - Douglas W. Cooper
  - H.L. Wolfe
  - et al.
- 1989
- Annual Technical Meeting of Institute of Environmental Sciences 1989
Acceptance criterion uncertainty during sampling inspection of wafers
- - R.J. Miller
  - Douglas W. Cooper
- 1989
- Annual Technical Meeting of Institute of Environmental Sciences 1989
Quantities, terminology, and symbols in photothermal and related spectroscopies (IUPAC recommendations 2004)
- - Masahide Terazima
  - Noboru Hirota
  - et al.
- 2004
- Pure and Applied Chemistry
Adaptive wiring for 20 nm scale epitaxial silicon Ohmic contacts to silicon nanowires
- - M.J. Rooks
  - G.M. Cohen
  - et al.
- 2007
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures