Origin of mosaic structure in relaxed Si1-xGex layers
- P.M. Mooney
- F.K. LeGoues
- et al.
- 1993
- ICDS 1993
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148 results for Jack O. Chu
Facet formation in strained Si1-x Gex films
- M.A. Lutz
- R.M. Feenstra
- et al.
- 1994
- Surface Science
Modulation-doped n-type Si/SiGe with inverted interface
- K. Ismail
- J.O. Chu
- et al.
- 1994
- Applied Physics Letters
Room-temperature electron mobility in strained Si/SiGe heterostructures
- S. Nelson
- K. Ismail
- et al.
- 1993
- Applied Physics Letters
Systematics of electron mobility in Si/SiGe heterostructures
- S. Nelson
- K. Ismail
- et al.
- 1993
- Applied Physics Letters
Strain relaxation and mosaic structure in relaxed SiGe layers
- P.M. Mooney
- F. Legoues
- et al.
- 1993
- Applied Physics Letters
Spatially resolved Raman spectroscopy of a step graded Ge xSi1-x strain relief structure
- J.C. Tsang
- F.H. Dacol
- et al.
- 1993
- Applied Physics Letters
Crystallographic tilting resulting from nucleation limited relaxation
- F. Legoues
- P.M. Mooney
- et al.
- 1993
- Applied Physics Letters
Raman scattering analysis of relaxed GexSi1-x alloy layers
- P.M. Mooney
- F.H. Dacol
- et al.
- 1993
- Applied Physics Letters
Electron transport properties of Si/SiGe heterostructures: Measurements and device implications
- K. Ismail
- S. Nelson
- et al.
- 1993
- Applied Physics Letters