Hot carrier electroluminescence from a single carbon nanotube
- Marcus Freitag
- Vasili Perebeinos
- et al.
- 2004
- Nano Letters
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135 results for James C. Tsang
Intercalation compounds of metal hydroxides with group V layered dichalcogenides
- G. V. Subba Rao
- M.W. Shafer
- et al.
- 2002
- Journal of Physical Chemistry
How industry matters in balancing the federal research portfolio
- J.C. Tsang
- 2002
- Technology in Society
High-speed CMOS circuit testing by 50 ps time-resolved luminescence measurements
- Franco Stellari
- Franco Zappa
- et al.
- 2001
- IEEE Transactions on Electron Devices
Why hot carrier emission based timing probes will work for 50 nm, 1V CMOS technologies
- J.C. Tsang
- M.V. Fischetti
- 2001
- Microelectronics Reliability
Watching chips work: Picosecond hot electron light emission from integrated circuits
- J.A. Kash
- J.C. Tsang
- 2000
- Journal of Crystal Growth
Time-resolved optical characterization of electrical activity in integrated circuits
- James C. Tsang
- Jeffrey Alan Kash
- et al.
- 2000
- Proceedings of the IEEE
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis
- M. McManus
- J.A. Kash
- et al.
- 2000
- Microelectronics Reliability
Picosecond imaging circuit analysis
- James C. Tsang
- Jeffrey A. Kash
- et al.
- 2000
- IBM J. Res. Dev
Backside optical emission diagnostics for excess IDDQ
- J.A. Kash
- J.C. Tsang
- et al.
- 1998
- IEEE Journal of Solid-State Circuits