Single-event-upset and alpha-particle emission rate measurement techniques
- Michael S. Gordon
- Kenneth P. Rodbell
- et al.
- 2008
- IBM J. Res. Dev
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126 results for Ken Rodbell
Low-energy proton-induced single-event-upsets in 65 nm node, silicon-on-insulator, latches and memory cells
- Kenneth P. Rodbell
- David F. Heidel
- et al.
- 2007
- IEEE TNS
Importance of BEOL modeling in single event effect analysis
- Henry H. K. Tang
- Conal E. Murray
- et al.
- 2007
- IEEE TNS
Latch design techniques for mitigating single event upsets in 65 nm SOI device technology
- A.J. KleinOsowski
- Ethan H. Cannon
- et al.
- 2007
- IEEE TNS
Alpha particle mitigation strategies to reduce chip soft error upsets
- C. Cabral
- K.P. Rodbell
- et al.
- 2007
- Journal of Applied Physics
Single-event-upset critical charge measurements and modeling of 65 nm silicon-on-insulator latches and memory cells
- David F. Heidel
- Kenneth P. Rodbell
- et al.
- 2006
- IEEE TNS
On the use of alloying elements for Cu interconnect applications
- K. Barmak
- C. Cabral
- et al.
- 2006
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Underlayer effects on texture evolution in copper films
- C.E. Murray
- K.P. Rodbell
- et al.
- 2006
- Thin Solid Films
Electrodeposition of bismuth thin films on n-GaAs (110)
- Philippe M. Vereecken
- Kenneth Rodbell
- et al.
- 2005
- Applied Physics Letters
Measurement of the flux and energy spectrum of cosmic-ray induced neutrons on the ground
- M. Gordon
- P. Goldhagen
- et al.
- 2004
- IEEE TNS