Protecting big blue from rogue subatomic particles
- Ethan H. Cannon
- A.J. KleinOsowski
- et al.
- 2007
- ICICDT 2007
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16 results for Ethan Cannon
Single-event-upset critical charge measurements and modeling of 65 nm silicon-on-insulator latches and memory cells
- David F. Heidel
- Kenneth P. Rodbell
- et al.
- 2006
- IEEE TNS
SEMM-2: A modeling system for single event upset analysis
- Henry H. K. Tang
- Ethan H. Cannon
- 2004
- IEEE TNS
SRAM SER in 90, 130 and 180 NM bulk and SOI technologies
- Ethan H. Cannon
- Daniel D. Reinhardt
- et al.
- 2004
- IRPS 2004
SRAM ser in 90, 130 and 180 nm bulk and SOI technologies
- Ethan H. Cannon
- Daniel D. Reinhardt
- et al.
- 2004
- IRPS 2004
Soft error rate scaling for emerging SOI technology options
- P. Oldiges
- K. Bernstein
- et al.
- 2002
- VLSI Technology 2002