Phaser: Phased methodology for modeling the system-level effects of soft errors
- Jude A. Rivers
- Pradip Bose
- et al.
- 2008
- IBM J. Res. Dev
Publications
Date
Featured collections
Popular topics
16 results for Ethan Cannon
Circuit design and modeling for soft errors
- A.J. KleinOsowski
- Ethan H. Cannon
- et al.
- 2008
- IBM J. Res. Dev
The impact of aging effects and manufacturing variation on SRAM soft-error rate
- Ethan H. Cannon
- A.J. KleinOsowski
- et al.
- 2008
- IEEE T-DMR
Latch design techniques for mitigating single event upsets in 65 nm SOI device technology
- A.J. KleinOsowski
- Ethan H. Cannon
- et al.
- 2007
- IEEE TNS
Single-event-upset critical charge measurements and modeling of 65 nm silicon-on-insulator latches and memory cells
- David F. Heidel
- Kenneth P. Rodbell
- et al.
- 2006
- IEEE TNS
SEMM-2: A modeling system for single event upset analysis
- Henry H. K. Tang
- Ethan H. Cannon
- 2004
- IEEE TNS