Ruilong Xie, Pietro Montanini, et al.
IEDM 2016
Experimental and modeling results are presented on the critical charge required to upset exploratory 65 nm silicon-on-insulator (SOI) circuits. Using a mono-energetic, collimated, beam of particles the charge deposition was effectively modulated and modeled. © 2006 IEEE.
Ruilong Xie, Pietro Montanini, et al.
IEDM 2016
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Applied Physics Letters
Phil Oldiges, Kenneth P. Rodbell, et al.
IEEE International SOI Conference 2010
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IEEE TNS