Radioactive Ni* tracer study of the nickel silicide growth mechanism
- J.E.E. Baglin
- H.A. Atwater
- et al.
- 1982
- Thin Solid Films
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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159 results for F.M. D'Heurle
Diffusion marker experiments with rare-earth silicides and germanides: Relative mobilities of the two atom species
- J.E.E. Baglin
- F.M. D'Heurle
- et al.
- 1981
- Journal of Applied Physics
Properties of tungsten silicide film on polycrystalline silicon
- M.Y. Tsai
- F.M. D'Heurle
- et al.
- 1981
- Journal of Applied Physics
Tantalum silicide films deposited by dc sputtering
- J. Angilello
- J.E.E. Baglin
- et al.
- 1981
- Journal of Electronic Materials
An interface - marker technique applied to the study of metal silicide growth
- J.E.E. Baglin
- F.M. D'Heurle
- et al.
- 1980
- Nuclear Instruments and Methods
The formation of silicides in Mo-W Bilayer films on si substrates: A marker experiment
- J.E.E. Baglin
- J. Dempsey
- et al.
- 1979
- Journal of Electronic Materials
2.22 The deposition by evaporation of CuAl alloy films
- F.M. d'Heurle
- C. Alliota
- et al.
- 1977
- Vacuum
Effects of Mg additions on the electromigration behavior of Al thin film conductors
- F.M. d'Heurle
- A. Gangulee
- et al.
- 1975
- Journal of Electronic Materials
Electrotransport in copper alloy films and the defect mechanism in grain boundary diffusion
- F.M. D'Heurle
- A. Gangulee
- 1975
- Thin Solid Films
Mass transport during electromigration in aluminum-magnesium thin films
- A. Gangulee
- F.M. d'Heurle
- 1975
- Thin Solid Films