Refractory metal silicide formation induced by As+ implantation
- M.Y. Tsai
- C.S. Petersson
- et al.
- 2008
- Applied Physics Letters
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159 results for F.M. D'Heurle
Observations on the hexagonal form of MoSi2 and WSi2 films produced by ion implantation and on related snowplow effects
- F.M. d'Heurle
- C.S. Petersson
- et al.
- 2008
- Journal of Applied Physics
The thin-film formation of rhodium silicides
- S. Petersson
- R.L. Anderson
- et al.
- 2008
- Journal of Applied Physics
Effects of additive elements on the phase formation and morphological stability of nickel monosilicide films
- C. Lavoie
- C. Detavernier
- et al.
- 2006
- Microelectronic Engineering
Coherent superconducting behavior of two metals (Al-Pb) in a synthetic filamentary structure
- D.P. Seraphim
- F.M. D'Heurle
- et al.
- 2004
- Applied Physics Letters
Metastable alloys of CuCo and CuAg thin films deposited in vacuum
- S. Mader
- H. Widmer
- et al.
- 2004
- Applied Physics Letters
Low-temperature formation of CoSi 2 in the presence of Au
- C. Detavernier
- C. Lavoie
- et al.
- 2004
- Journal of Applied Physics
Formation of embedded Co nanoparticles by reaction in Al/Co multilayers and impact on phase sequence
- P. Gas
- C. Bergman
- et al.
- 2004
- Applied Physics Letters
Diffusion in intermetallic compounds: The ordered Cu3Au rule, its history
- François M. D'Heurle
- Patrick Gas
- et al.
- 2004
- Zeitschrift fuer Metallkunde/Materials Research and Advanced Techniques
Effect of alloy additions on electromigration failures in thin aluminum films
- A. Gangulee
- F.M. D'Heurle
- 2003
- Applied Physics Letters