Schottky barrier height measurement by electron-beam induced voltage
- H.-C.W. Huang
- C.F. Aliotta
- et al.
- 1982
- Applied Physics Letters
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118 results for Paul S. Ho
Material reactions Al/Pd2Si/Si junctions. II. Kinetic rates
- P.S. Ho
- J.E. Lewis
- et al.
- 1982
- Journal of Applied Physics
Contactless measurement of schottky barrier heights using secondary electrons
- H.-C.W. Huang
- P.S. Ho
- 1982
- Applied Physics Letters
Grain-boundary diffusion of Sn in Pb
- K.K. Kim
- D. Gupta
- et al.
- 1982
- Journal of Applied Physics
Material reactions in Al/Pd2Si/Si junctions. I. Phase stability
- U. Köster
- P.S. Ho
- et al.
- 1982
- Journal of Applied Physics
General aspects of barrier layers for very-large-scale integration applications I: Concepts
- P.S. Ho
- 1982
- Thin Solid Films
Electron beam study of silicide Schottky diodes
- H.-C.W. Huang
- C.F. Aliotta
- et al.
- 1982
- Thin Solid Films
An X-ray study of domain structure and stress in Pd2Si films at Pd-Si interfaces
- Haydn Chen
- G.E. White
- et al.
- 1982
- Thin Solid Films
Electronic structure of silicide-silicon interfaces
- G.W. Rubloff
- P.S. Ho
- 1982
- Thin Solid Films
Electronic states and microstructure at the silicide-silicon interface
- P.S. Ho
- G.W. Rubloff
- 1982
- Thin Solid Films