Formation of the Schottky barrier at the Pd/Si interface
- R.J. Purtell
- P.S. Ho
- et al.
- 1983
- Physica B+C
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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118 results for Paul S. Ho
Chemical bonding and Schottky barrier formation at transition metal-silicon interfaces
- Paul S. Ho
- 1983
- JVSTA
Chemical bonding and reactions at Ti/Si and Ti/oxygen/Si interfaces
- R. Blitz
- G.W. Rubloff
- et al.
- 1983
- JVSTA
Contactless measurement of schottky barrier heights using secondary electrons
- H.-C.W. Huang
- P.S. Ho
- 1982
- Applied Physics Letters
Material reactions in Al/Pd2Si/Si junctions. I. Phase stability
- U. Köster
- P.S. Ho
- et al.
- 1982
- Journal of Applied Physics
Grain-boundary diffusion of Sn in Pb
- K.K. Kim
- D. Gupta
- et al.
- 1982
- Journal of Applied Physics
Schottky barrier height measurement by electron-beam induced voltage
- H.-C.W. Huang
- C.F. Aliotta
- et al.
- 1982
- Applied Physics Letters
Material reactions Al/Pd2Si/Si junctions. II. Kinetic rates
- P.S. Ho
- J.E. Lewis
- et al.
- 1982
- Journal of Applied Physics
General aspects of barrier layers for very-large-scale integration applications I: Concepts
- P.S. Ho
- 1982
- Thin Solid Films
Electron beam study of silicide Schottky diodes
- H.-C.W. Huang
- C.F. Aliotta
- et al.
- 1982
- Thin Solid Films