E. Burstein
Ferroelectrics
The domain structures of palladium and Pd2Si as well as their crystallographic relationship to the silicon substrates were determined on Si(111) and Si(100) samples by mapping X-ray diffraction pole figures. X-ray diffraction topography and rocking curve measurements were carried out for the silicon substrates in order to detect the presence of elastic and/or plastic deformation in the substrates caused by silicide formation. The stresses in the silicide films were determined from the bending of the silicon substrates using X-ray diffraction techniques. © 1982.
E. Burstein
Ferroelectrics
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
A. Nagarajan, S. Mukherjee, et al.
Journal of Applied Mechanics, Transactions ASME
A. Gangulee, F.M. D'Heurle
Thin Solid Films