An X-ray study of domain structure and stress in Pd2Si films at Pd-Si interfaces
- Haydn Chen
- G.E. White
- et al.
- 1982
- Thin Solid Films
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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118 results for Paul S. Ho
Electronic structure of silicide-silicon interfaces
- G.W. Rubloff
- P.S. Ho
- 1982
- Thin Solid Films
Electronic states and microstructure at the silicide-silicon interface
- P.S. Ho
- G.W. Rubloff
- 1982
- Thin Solid Films
Transmission electron microscopy investigation of silicide formation on slightly oxidized silicon substrates
- H. Föll
- P.S. Ho
- 1981
- Journal of Applied Physics
Cross-sectional transmission electron microscopy of silicon-silicide interfaces
- F. Föll
- P.S. Ho
- et al.
- 1981
- Journal of Applied Physics
Chemical bonding and reactions at the Pd/Si interface
- G.W. Rubloff
- P.S. Ho
- et al.
- 1981
- Physical Review B
Determination of vacancy mechanism for grain boundary self-diffusion by computer simulation
- R.W. Balluffi
- Thomas Kwok
- et al.
- 1981
- Scripta Metallurgica
Chemical bonding and electronic structure of Pd2Si
- P.S. Ho
- G.W. Rubloff
- et al.
- 1980
- Physical Review B
Thermal reactions between aluminum and palladium layered films
- U. Köster
- P.S. Ho
- et al.
- 1980
- Thin Solid Films
Diffusion processes in thin films
- D. Gupta
- P.S. Ho
- 1980
- Thin Solid Films