Summary Abstract: Electromigration studies of al-intermetallic structures
- T. Kwok
- P.S. Ho
- et al.
- 1984
- JVSTA
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118 results for Paul S. Ho
Chemical reaction and silicide formation at the Pt/Si interface
- R. Mate
- R.J. Purtell
- et al.
- 1984
- JVSTA
Properties of interfaces in (Cdzn)S/culnse2heterojunctions
- J.E. Lewis
- P.S. Ho
- et al.
- 1984
- JVSTA
BASIC PROBLEMS IN INTERCONNECT METALLIZATION FOR VLSI APPLICATIONS.
- P.S. Ho
- 1982
- Vacuum Congress - Conference on Solid Surfaces 1982
Effects of variations of silicide characteristics on the Schottky-barrier height of silicide-silicon interfaces
- P.E. Schmid
- P.S. Ho
- et al.
- 1983
- Physical Review B
Low temperature interdiffusion in Cu/Ni thin films
- H. Lefakis
- J.F. Cain
- et al.
- 1983
- Thin Solid Films
Formation of the Schottky barrier at the Pd/Si interface
- R.J. Purtell
- P.S. Ho
- et al.
- 1983
- Physica B+C
Schottky barrier formation at Pd, Pt, and Ni/Si(111) interfaces
- R.J. Purtell
- G. Hollinger
- et al.
- 1983
- JVSTA
Chemical bonding and Schottky barrier formation at transition metal-silicon interfaces
- Paul S. Ho
- 1983
- JVSTA
Chemical bonding and reactions at Ti/Si and Ti/oxygen/Si interfaces
- R. Blitz
- G.W. Rubloff
- et al.
- 1983
- JVSTA