Stoichiometry and atomic defects in rf-sputtered SiO2
- T.W. Hickmott
- J.E.E. Baglin
- 2008
- Journal of Applied Physics
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94 results for J. E.E. Baglin
Formation of iridium silicides from Ir thin films on Si substrates
- S. Petersson
- J.E.E. Baglin
- et al.
- 2008
- Journal of Applied Physics
The formation of silicides from thin films of some rare-earth metals
- J.E.E. Baglin
- F.M. D'Heurle
- et al.
- 2008
- Applied Physics Letters
Pulsed laser irradiation of lead-implanted single-crystal copper films
- E. Rimini
- J.E.E. Baglin
- 2008
- Applied Physics Letters
Laser annealing of silicon implanted with both argon and arsenic
- E. Rimini
- W.K. Chu
- et al.
- 2008
- Applied Physics Letters
Ion beam annealing of semiconductors
- R.T. Hodgson
- J.E.E. Baglin
- et al.
- 2008
- Applied Physics Letters
Shallow junctions by high-dose As implants in Si: Experiments and modeling
- M.Y. Tsai
- F.F. Morehead
- et al.
- 2008
- Journal of Applied Physics
The thin-film formation of rhodium silicides
- S. Petersson
- R.L. Anderson
- et al.
- 2008
- Journal of Applied Physics
Direct observation of waveguide formation in KGd(WO 4) 2 by low dose H + ion implantation
- C.A. Merchant
- J.S. Aitchison
- et al.
- 2006
- Applied Physics Letters
Determination of surface impurity concentration profiles by nuclear backscattering
- James F. Ziegler
- John E. E. Baglin
- 2003
- Journal of Applied Physics