Residual Stress, Chemical Etch Rate, Refractive Index, and Density Measurements on SiO2 Films Prepared Using High Pressure Oxygen
- E.A. Irene
- D.W. Dong
- et al.
- 2019
- JES
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35 results for D.W. Dong
Ellipsometry Measurements of Polycrystalline Silicon Films
- E.A. Irene
- D.W. Dong
- 2019
- JES
An XPS and TEM Study of Intrinsic Adhesion Between Polyimide and Cr Films
- N.J. Chou
- D.W. Dong
- et al.
- 2019
- JES
Observation of amorphous silicon regions in silicon-rich silicon dioxide films
- A. Hartstein
- J.C. Tsang
- et al.
- 2008
- Applied Physics Letters
Dual electron injector structure
- D.J. Dimaria
- D.W. Dong
- 2008
- Applied Physics Letters
High current injection into SiO2 from Si rich SiO2 films and experimental applications
- D.J. DiMaria
- D.W. Dong
- 2008
- Journal of Applied Physics
Charge trapping studies in SiO2 using high current injection from Si-rich SiO2 films
- D.J. DiMaria
- R. Ghez
- et al.
- 2008
- Journal of Applied Physics
Attenuated total reflectance study of silicon-rich silicon dioxide films
- A. Hartstein
- D.J. Dimaria
- et al.
- 2008
- Journal of Applied Physics
Electron heating in silicon dioxide and off-stoichiometric silicon dioxide films
- D.J. DiMaria
- T.N. Theis
- et al.
- 1985
- Journal of Applied Physics
Direct measurement of the energy distribution of hot electrons in silicon dioxide
- S.D. Brorson
- D.J. DiMaria
- et al.
- 1985
- Journal of Applied Physics