Atomic hydrogen-induced degradation of thin SiO2 gate oxides
- E. Cartier
- D.A. Buchanan
- et al.
- 1995
- Journal of Non-Crystalline Solids
Publications
Date
Featured collections
Popular topics
119 results for D.J. DiMaria
Hot-electron-induced hydrogen redistribution and defect generation in metal-oxide-semiconductor capacitors
- D.A. Buchanan
- A.D. Marwick
- et al.
- 1994
- Journal of Applied Physics
Defect generation in 3.5 nm silicon dioxide films
- D.A. Buchanan
- D.J. DiMaria
- et al.
- 1994
- Applied Physics Letters
Degradation of thin SiO 2 gate oxides by atomic hydrogen
- F. Cartier
- D.J. DiMaria
- et al.
- 1994
- DRC 1994
Theory of high-field electron transport and impact ionization in silicon dioxide
- D. Arnold
- E. Cartier
- et al.
- 1994
- Physical Review B
Impact ionization, trap creation, degradation, and breakdown in silicon dioxide films on silicon
- D.J. DiMaria
- E. Cartier
- et al.
- 1993
- Journal of Applied Physics
Measurements of hydrogen redistribution in hot electron injection of MOS capacitors
- A.D. Marwick
- D.A. Buchanan
- et al.
- 1992
- MRS Proceedings 1992
Impact ionization, degradation, and breakdown in SiO2
- D.J. Dimaria
- E. Cartier
- et al.
- 1992
- MRS Proceedings 1992
Optimized Silicon-Rich Oxide (SRO) Deposition Process for 5-V-Only Flash EEPROM Applications
- Leonello Dori
- Alexandre Acovic
- et al.
- 1993
- IEEE Electron Device Letters
Hot-electron dynamics in SiO2 and the degradation of the Si/SiO2-interface
- E. Cartier
- D.J. DiMaria
- 1993
- Microelectronic Engineering