Publications

119 results for D.J. DiMaria

Interface traps induced by hole trapping in metal-oxide semiconductor devices
- - Y. Roh
  - L.P. Trombetta
  - et al.
- 1995
- Journal of Non-Crystalline Solids
Hot-electron-induced hydrogen redistribution and defect generation in metal-oxide-semiconductor capacitors
- - D.A. Buchanan
  - A.D. Marwick
  - et al.
- 1994
- Journal of Applied Physics
Defect generation in 3.5 nm silicon dioxide films
- - D.A. Buchanan
  - D.J. DiMaria
  - et al.
- 1994
- Applied Physics Letters
Degradation of thin SiO ₂ gate oxides by atomic hydrogen
- - F. Cartier
  - D.J. DiMaria
  - et al.
- 1994
- DRC 1994
Theory of high-field electron transport and impact ionization in silicon dioxide
- - D. Arnold
  - E. Cartier
  - et al.
- 1994
- Physical Review B
Impact ionization, trap creation, degradation, and breakdown in silicon dioxide films on silicon
- - D.J. DiMaria
  - E. Cartier
  - et al.
- 1993
- Journal of Applied Physics
Impact ionization, degradation, and breakdown in SiO₂
- - D.J. Dimaria
  - E. Cartier
  - et al.
- 1992
- MRS Proceedings 1992
Measurements of hydrogen redistribution in hot electron injection of MOS capacitors
- - A.D. Marwick
  - D.A. Buchanan
  - et al.
- 1992
- MRS Proceedings 1992
Hot-electron dynamics in SiO₂ and the degradation of the Si/SiO₂-interface
- - E. Cartier
  - D.J. DiMaria
- 1993
- Microelectronic Engineering
Optimized Silicon-Rich Oxide (SRO) Deposition Process for 5-V-Only Flash EEPROM Applications
- - Leonello Dori
  - Alexandre Acovic
  - et al.
- 1993
- IEEE Electron Device Letters