Schottky diode analysis for evaluation of RIE effects on silicon surfaces
- P. Spirito
- C.M. Ransom
- et al.
- 1986
- Solid-State Electronics
Publications
14443 results for Physical Sciences
Low temperature material reaction at the Ti/Si(111) interface
- R.M. Tromp
- G.W. Rubloff
- et al.
- 1986
- JVSTA
Picosecond spin dynamics in dilute magnetic systems
- D.D. Awschalom
- J.-M. Halbout
- 1986
- Journal of Magnetism and Magnetic Materials
Effects of deposition methods on the temperature-dependent resistivity of tunasten films
- L. Krusin-Elbaum
- K.Y. Ahn
- et al.
- 1986
- JVSTA
Atomic structure of the epitaxial Al–Si interface
- F. Legoues
- W. Krakow
- et al.
- 1986
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Properties of Cr-N films produced by reactive sputtering
- K.K. Shih
- D.B. Dove
- et al.
- 1986
- JVSTA
Interaction and vibrations of CN- chemisorbed on CU(100):theoretical studies
- K. Hermann
- W. Möller
- et al.
- 1986
- Journal of Electron Spectroscopy and Related Phenomena
Surface analysis for materials technology within a computer industry
- C.R. Brundle
- 1986
- Fresenius' Zeitschrift für Analytische Chemie
Thin films for magnetic recording technology: A review
- J.K. Howard
- 1986
- JVSTA
New models for the structure of the electrochemical interface
- Wolfgang Schmickler
- Douglas Henderson
- 1986
- Progress in Surface Science