Determination of thickness errors and boundary roughness from the measured performance of a multilayer coating
- Eberhard Spiller
- Alan E. Rosenbluth
- 1989
- Proceedings of SPIE 1989
Publications
14443 results for Physical Sciences
THIN FILM TECHNOLOGY FOR ADVANCED SEMICONDUCTORS. PART 3: VLSI INTERCONNECT METALIZATION.
- P.S. Ho
- 1985
- Semiconductor International
High-field backward-wave phonon spectroscopy of Si:In
- George Mozurkewich
- R.L. Melcher
- 1985
- Physical Review B
Small normal-metal loop coupled to an electron reservoir
- M. Büttiker
- 1985
- Physical Review B
Optical properties and microstructure of gold fluorocarbon-polymer composite films
- J. Perrin
- B. Despax
- et al.
- 1985
- Physical Review B
Conductivity sensitivity of inelastic scanning tunneling microscopy
- G. Binnig
- N. Garcia
- et al.
- 1985
- Physical Review B
Surface morphology of GaAs(110) by scanning tunneling microscopy
- R.M. Feenstra
- A.P. Fein
- 1985
- Physical Review B
Optical dephasing by nonequilibrium phonons in LaF3
- R.S. Meltzer
- R.M. Macfarlane
- 1985
- Physical Review B
High-efficiency photochemical hole burning for an infrared color center
- W.E. Moerner
- F.M. Schellenberg
- et al.
- 1985
- Physical Review B
Small cavities as major active sites for surface enhanced Raman scattering
- H. Seki
- T.J. Chuang
- et al.
- 1985
- Surface Science