Spectroscopic characterization of fluorinated silicon single crystal surfacesJ.F. MorarF.R. McFeely1984JVSTA
Summary Abstract: A Quantitative Ion Beam Process Applied to the Deposition of Aluminum Nitride Thin FilmsJ.M.E. HarperH.T.G. Hentzellet al.1984JVSTA
Summary Abstract: Quantitative particulate contamination studies utilizing reduced turbulence pumping and ventingPeter D. Hoh1984JVSTA
Summary Abstract: Search for precursor states: Molecular adsorption of N2 on Ni(100)C.R. BrundleJ. Behmet al.1984JVSTA
Grain structure variation with temperature for evaporated metal filmsH.T.G. HentzellC.R.M. Grovenoret al.1984JVSTA
Summary Abstract: Excited states of physisorbed and chemisorbed adsorbates and their decay mechanismsPh. AvourisJ.E. Demuthet al.1984JVSTA