Critical current density of strained multilayer thin films of Nd 1.83Ce0.17CuOx/YBa2Cu 3O7-δ
- R. Gross
- A. Gupta
- et al.
- 1990
- Applied Physics Letters
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.