Comprehensive study of effective current variability and MOSFET parameter correlations in 14nm multi-fin SOI FINFETs
- Abhijeet Paul
- Andres Bryant
- et al.
- 2013
- IEDM 2013
Publications
Date
Featured collections
Popular topics
14 results at IEDM 2013
Co-integration of InGaAs n- and SiGe p-MOSFETs into digital CMOS circuits using hybrid dual-channel ETXOI substrates
- Lukas Czornomaz
- N. Daix
- et al.
- 2013
- IEDM 2013
Density scaling with gate-all-around silicon nanowire MOSFETs for the 10 nm node and beyond
- Sarunya Bangsaruntip
- K. Balakrishnan
- et al.
- 2013
- IEDM 2013
200 mm wafer-scale integration of sub-20 nm sacrificial nanofluidic channels for manipulating and imaging single DNA molecules
- C. Wang
- S.W. Nam
- et al.
- 2013
- IEDM 2013