Boron activation and diffusion in silicon and strained silicon-on-insulator by rapid thermal and flash lamp annealings
- F. Lanzerath
- D. Buca
- et al.
- 2008
- Journal of Applied Physics
Publications
2360 results at Journal of Applied Physics
Transparency of thin metal films on semiconductor substrates
- H.J. Hovel
- 2008
- Journal of Applied Physics
Effects of electron-beam irradiation on the properties of CVD Si 3N4 films in MNOS structures
- T.P. Ma
- B.H. Yun
- et al.
- 2008
- Journal of Applied Physics
Specimen replication for electron microscopy using x rays and x-ray resist
- Ralph Feder
- David Sayre
- et al.
- 2008
- Journal of Applied Physics
Contact currents in silicon nitride
- P.C. Arnett
- D.J. Dimaria
- 2008
- Journal of Applied Physics
Tables of stopping cross sections for 4He ions in solids
- J.F. Ziegler
- W.K. Chu
- 2008
- Journal of Applied Physics
Some temperature-dependent properties of niobium tunnel junctions
- R.F. Broom
- 2008
- Journal of Applied Physics
Current runaway in insulators affected by impact ionization and recombination
- N. Klein
- P. Solomon
- 2008
- Journal of Applied Physics
Determination of insulator bulk trapped charge densities and centroids from photocurrent-voltage charactersitcs of MOS structures
- D.J. DiMaria
- 2008
- Journal of Applied Physics
Contact metallurgy for shallow junction Si devices
- C.J. Kircher
- 2008
- Journal of Applied Physics