IIIB-1 Degradation of 77-K MOSFET Characteristics Due to Channel Hot Electrons
- Jack Y. C. Sun
- Matthew R. Wordeman
- 1984
- IEEE T-ED
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Evolution of the MOSFET Dynamic RAM—A Personal View
- Robert H. Dennard
- 1984
- IEEE T-ED
Method for Determining the Emitter and Base Series Resistances of Bipolar Transistors
- Tak H. Ning
- Denny D. Tang
- 1984
- IEEE T-ED
IIIA-5 Two-Dimensional Simulation of HEMT and GaAs Gate Heterojunction FET
- J.Y.-F. Tang
- 1984
- IEEE T-ED
Reciprocity Behavior of Photoresists in Excimer Laser Lithography
- Sondra Rice
- Kanti Jain
- 1984
- IEEE T-ED
Temperature Dependence of FET Properties for Cr-Doped and LEC Semi-Insulating GaAs Substrates
- Thomas W. Hickmott
- 1984
- IEEE T-ED
Electromigration Lifetime Sudies of Submicrometer-Linewidth Al-Cu Conductors
- Subramanian S. Iyer
- Chung-YU Ting
- 1984
- IEEE T-ED
IIIA-4 P-channel Ga0.5 Al0.5 As/GaAs MODFET's
- W.I. Wang
- S. Tiwari
- 1984
- IEEE T-ED
Accuracy of an Effective Channel Length/External Resistance Extraction Algorithm for MOSFET's
- Steven E. Laux
- 1984
- IEEE T-ED
Generalized Scaling Theory and Its Application to a 1/4 micrometer MOSFET Design
- Robert H. Dennard
- Matthew R. Wordeman
- 1984
- IEEE T-ED