PaperA Fully Scaled Submicrometer NMOS Technology Using Direct-Write E-Beam LithographyMatthew R. Wordeman, April M. Schweighart, et al.IEEE T-ED
PaperAlpha-Particle-Induced Soft Error Rate in VLSI CircuitsGeorge A. Sai-Halasz, Matthew R. Wordeman, et al.IEEE Journal of Solid-State Circuits
Conference paperA fully-integrated switched-capacitor 2:1 Voltage converter with regulation capability and 90% efficiency at 2.3A/mm2Leland Chang, Robert K. Montoye, et al.VLSI Circuits 2010
Conference paperFDSOI CMOS with dual backgate control for performance and power modulationJeng-Bang Yau, Jin Cai, et al.VLSI-TSA 2009