High Performance Data Processing in Josephson Technology
- A. Mukherjee
- 1982
- IEEE Electron Device Letters
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306 results at IEEE Electron Device Letters
Electronically Adjustable Delay for Josephson Technology
- Richard E. Harris
- P. Wolf
- et al.
- 1982
- IEEE Electron Device Letters
A Josephson Technology System Level Experiment
- M.B. Ketchen
- B.J. van der Hoeven
- et al.
- 1981
- IEEE Electron Device Letters
An Electrochemical P-N Junction Etch-Stop for the Formation of Silicon Microstructures
- T.N. Jackson
- M.A. Tischler
- et al.
- 1981
- IEEE Electron Device Letters
Sensitive Technique for Measuring Small MOS Gate Currents
- F.H. Gaensslen
- J.M. Aitken
- 1980
- IEEE Electron Device Letters
Monte Carlo Modeling of the Transport of Ionizing Radiation Created Carriers in Integrated Circuits
- G.A. Sai-Halasz
- M.R. Wordeman
- 1980
- IEEE Electron Device Letters