RD3D 〈Computer Simulation of Resist Development in Three Dimensions〉
- Fletcher Jones
- Jurij Paraszczak
- 1981
- IEEE T-ED
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465 results at IEEE T-ED
IVA-7 Surface Layer Impurity Accumulation Due to Evaporation of GaAs During Annealing
- J. Woodall
- H. Rupprecht
- et al.
- 1981
- IEEE T-ED
Optical Switching in Thin Film Electroluminescent Devices with Inherent Memory Characteristics
- Omesh Sahni
- Webster E. Howard
- et al.
- 1981
- IEEE T-ED
Mesostructure Electronics
- Peter J. Price
- 1981
- IEEE T-ED
Importance of Boundary Conditions to Conduction in Short Samples
- James J. Rosenberg
- Ellen J. Yoffa
- et al.
- 1981
- IEEE T-ED
Evaluation of Light Sources for TDI Polysilicon Electrode CCD Document Scanners
- A.J. Schell-Sorokin
- G.W. Lynch
- 1981
- IEEE T-ED
The Effect of Concrete Shielding on Cosmic Ray Induced Soft Fails in Electronic Systems
- James F. Ziegler
- 1981
- IEEE T-ED
Resolution and Linewidth Tolerances in Electron Beam and Optical Projection Lithography
- Tung Symon Chang
- David F. Kyser
- et al.
- 1981
- IEEE T-ED
The Effect of Base Doping on the Performance of Si Bipolar Transistors at Low Temperatures
- William P. Dumke
- 1981
- IEEE T-ED
TP-A6 The Behavior of Schottky Barriers to GaAs as a function of Annealing Temperature
- H.J. Hovel
- C. Lanza
- 1980
- IEEE T-ED