Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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42 results at Journal of Physics D: Applied Physics

Measurement of soft X-ray mass absorption coefficients by a thin film technique using proton-induced X-rays
- - A. Lurio
  - W. Reuter
- 2001
- Journal of Physics D: Applied Physics
Comment on 'An investigation of nonlinear transmission lines and shock waves'
- - R. Landauer
- 2001
- Journal of Physics D: Applied Physics
Colinear thin-film acousto-optic scanner
- - F.R. Gfeller
- 2001
- Journal of Physics D: Applied Physics
X-ray production range in solids by 2-15 keV electrons
- - W. Reuter
  - J.D. Kuptsis
  - et al.
- 2001
- Journal of Physics D: Applied Physics
Energy flux onto an RF magnetron surface
- - I. Lin
  - R.L. Sandstrom
  - et al.
- 2000
- Journal of Physics D: Applied Physics
The electrical and optical behaviour of lamp-annealed Si-implanted InP(Fe)
- - Govind P. Kothiyal
  - Kwang S. Seo
- 2000
- Journal of Physics D: Applied Physics
Etching of silicon and silicon dioxide by halofluorocarbon plasmas
- - E. Occhiello
  - F. Garbassi
  - et al.
- 2000
- Journal of Physics D: Applied Physics
Interface morphology in strained layer epitaxy of Si/Si_1-xGe_x layers studied by x-ray scattering under grazing incidence and atomic force microscopy
- - Z. Kovats
  - T. Salditt
  - et al.
- 1999
- Journal of Physics D: Applied Physics
Low density of states at the epitaxial CaF₂-Si(111) interface
- - M. Dähne-Prietsch
  - I. Manke
  - et al.
- 1999
- Journal of Physics D: Applied Physics
Periodic domain inversion in poled KTiOPO₄ via high-resolution x-ray topography and diffraction-space mapping
- - Z. Hu
  - P.A. Thomas
  - et al.
- 1996
- Journal of Physics D: Applied Physics