Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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134 results at IEEE Transactions on Electron Devices

Device-optimization technique for robust and low-power FinFET SRAM design in NanoScale era
- - Aditya Bansal
  - Saibal Mukhopadhyay
  - et al.
- 2007
- IEEE Transactions on Electron Devices
Understanding Coulomb effects in nanoscale Schottky-barrier-FETs
- - Klaus Michael Indlekofer
  - Joachim Knoch
  - et al.
- 2007
- IEEE Transactions on Electron Devices
The impact of device footprint scaling on high-performance CMOS logic technology
- - Jie Deng
  - Keunwoo Kim
  - et al.
- 2007
- IEEE Transactions on Electron Devices
Base charge dynamics of abrupt base-emitter junction HBTs and its representation in transistor models
- - B. Sheinman
  - D. Ritter
- 2007
- IEEE Transactions on Electron Devices
Low thermal budget processing for sequential 3-D IC fabrication
- - Bipin Rajendran
  - Rohit S. Shenoy
  - et al.
- 2007
- IEEE Transactions on Electron Devices
An investigation of negative differential resistance and novel collector-current kink effects in SiGe HBTs operating at cryogenic temperatures
- - Jiahui Yuan
  - John D. Cressler
  - et al.
- 2007
- IEEE Transactions on Electron Devices
Modeling of variation in submicrometer CMOS ULSI technologies
- - Scott K. Springer
  - Sungjae Lee
  - et al.
- 2006
- IEEE Transactions on Electron Devices
SiGe HBT without Selectively Implanted Collector (SIC) exhibiting f _max = 310 GHz and BV_CEo = 2 v
- - Jae-Sung Rieh
  - Marwan Khater
  - et al.
- 2006
- IEEE Transactions on Electron Devices
Netlisting and modeling well-proximity effects
- - Josef Watts
  - Ke-Wei Su
  - et al.
- 2006
- IEEE Transactions on Electron Devices
High-density reduced-stack logic circuit techniques using independent-gate controlled double-gate devices
- - Meng-Hsueh Chiang
  - Keunwoo Kim
  - et al.
- 2006
- IEEE Transactions on Electron Devices