Electrode Flatness Requirements for Cathode Projection Microfabrication Systems
- George A. Wardly
- 1975
- IEEE T-ED
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In-Situ Measurement of Dielectric Thickness During Etching or Developing Processes
- Karl L. Konnerth
- Frederick H. Dill
- 1975
- IEEE T-ED
The Implanted Stepped-Oxide MNOSFET
- F.J. Krick
- 1975
- IEEE T-ED
Frame-Time Analysis of the Performance of Refreshed Matrix-Addressed Displays
- Paul M. Alt
- Peter Pleshko
- 1975
- IEEE T-ED
Characterization of Positive Photoresist
- Frederick H. Dill
- William P. Hornberger
- et al.
- 1975
- IEEE T-ED
V–1 Laser Fabrication of Large-Area Arrays: Thin-Film Silicon Isolated Devices on Fused Silica Substrates
- R.A. Laff
- G.L. Hutchins
- 1974
- IEEE T-ED
Scanning Limitations of Liquid-Crystal Displays
- Paul M. Alt
- Peter Pleshko
- 1974
- IEEE T-ED
Bistable Switching and Conduction Mechanisms in Nb-Nb2O5-Bi Junctions
- S. Basavaiah
- K.C. Park
- 1973
- IEEE T-ED
A Thin-Film Integrated Incandescent Display
- Frederick Hochberg
- Hugo K. Seitz
- et al.
- 1973
- IEEE T-ED
A Subnanosecond Josephson Tunneling Device Memory Cell
- H.H. Zappe
- 1973
- IEEE T-ED