X-ray photoelectron spectroscopy study of chemically-etched NdCeCuO surfaces
- R.P. Vasquez
- A. Gupta
- et al.
- 1991
- Solid State Communications
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Oxygen interaction with defects at the Si/SiO2 interface
- J.H. Stathis
- S. Rigo
- et al.
- 1991
- Solid State Communications
Incommensurate epitaxial growth of Cu on Pd{111}
- H. Li
- D. Tian
- et al.
- 1991
- Solid State Communications
Raman measurements of YBa2Cu3Ox as a function of oxygen content
- Gerald Burns
- F.H. Dacol
- et al.
- 1991
- Solid State Communications
A low-energy electron diffraction study of the Pd{0 0 1}c(2 × 2)-Mn adsorbed system
- D. Tian
- R.F. Lin
- et al.
- 1990
- Solid State Communications
Infrared active phonons in (Pr2-xCex)CuO4
- M.K. Crawford
- G. Burns
- et al.
- 1990
- Solid State Communications
Effect of atomic size on the minimum X-ray absorption coefficient in the six-beam Borrmann diffraction
- R.E. Feldman
- T.C. Huang
- 1990
- Solid State Communications
Carrier concentration dependence of Tc in the layered copper oxides
- Vladimir Z. Kresin
- H. Morawitz
- 1990
- Solid State Communications
Experimental and theoretical evidence of image states at semiconductor surfaces: The case of GaP(1 1 0)
- F. Manghi
- P. Perfetti
- et al.
- 1990
- Solid State Communications
Oxygen mobility in YBa2Cu3O7-δ: A Raman study
- Gerald Burns
- F.H. Dacol
- et al.
- 1990
- Solid State Communications