Total-dose and SEU characterization of 0.25 micron CMOS/SOI integrated circuit memory technologies
- C. Brothers
- R. Pugh
- et al.
- 1997
- IEEE TNS
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64 results at IEEE TNS
Interface Defect Formation in MOSFETs by Atomic Hydrogen Exposure
- R.E. Stahlbush
- E. Cartier
- 1994
- IEEE TNS
Ion Microbeam Radiation System
- D. Heidel
- U. Bapst
- et al.
- 1993
- IEEE TNS
A hardened field insulator
- G.J. Hu
- J.M. Aitken
- et al.
- 1981
- IEEE TNS
An intense pulsed barium ion source
- J.M. Neri
- D.A. Hammer
- et al.
- 1981
- IEEE TNS
The gsi data acquisition system (EDAS)
- Otto Siart
- Ruth Thieme
- et al.
- 1979
- IEEE TNS
Avalanche injection of holes into SiO2
- J.M. Aitken
- D.R. Young
- 1977
- IEEE TNS
Electron injection studies of radiation induced positive charge in MOS devices
- J.M. Aitken
- D.J. DiMaria
- et al.
- 1976
- IEEE TNS
A time shared system for multiple independent laboratories
- J. Birnbaum
- 1971
- IEEE TNS
On the merits of interface standardization: A round table discussion
- Charles.D Goodman
- Tom Droege
- et al.
- 1970
- IEEE TNS