Publications

139 results at IEEE Transactions on Electron Devices

Impact ionization MOS (I-MOS) - Part II : Experimental results
- - Kailash Gopalakrishnan
  - Raymond Woo
  - et al.
- 2005
- IEEE Transactions on Electron Devices
Impact ionization MOS (I-MOS) - Part I : Device and circuit simulations
- - Kailash Gopalakrishnan
  - Peter B. Griffin
  - et al.
- 2005
- IEEE Transactions on Electron Devices
Impact of ion implantation damage and thermal budget on mobility enhancement in strained-Si N-channel MOSFETs
- - Guangrui Xia
  - Hasan M. Nayfeh
  - et al.
- 2004
- IEEE Transactions on Electron Devices
Fabrication of metal gated FinFETs through complete gate silicidation with Ni
- - Jakub Kedzierski
  - Meikei Ieong
  - et al.
- 2004
- IEEE Transactions on Electron Devices
Improved hot-electron reliability in strained-Si nMOS
- - David Onsongo
  - David Q. Kelly
  - et al.
- 2004
- IEEE Transactions on Electron Devices
CMOS circuit performance enhancement by surface orientation optimization
- - Leland Chang
  - Meikei Ieong
  - et al.
- 2004
- IEEE Transactions on Electron Devices
Double gate-MOSFET subthreshold circuit for ultralow power applications
- - Jae-Joon Kim
  - Kaushik Roy
- 2004
- IEEE Transactions on Electron Devices
Ultrathin Al₂O₃ and HfO₂ gate dielectrics on surface-nitrided Ge
- - James Jer-Hueih Chen
  - Nestor A. Bojarczuk Jr.
  - et al.
- 2004
- IEEE Transactions on Electron Devices
SODEL FET: Novel channel and source/drain profile engineering schemes by selective Si epitaxial growth technology
- - Satoshi Inaba
  - Kiyotaka Miyano
  - et al.
- 2004
- IEEE Transactions on Electron Devices
Testing and diagnostics of CMOS circuits using light emission from off-state leakage current
- - Franco Stellari
  - Peilin Song
  - et al.
- 2004
- IEEE Transactions on Electron Devices