Picosecond noninvasive optical detection of internal electrical signals in flip-chip-mounted silicon integrated circuits
- H. Heinrich
- 1990
- IBM J. Res. Dev
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On-chip wiring for VLSI. Status and directions
- M.B. Small
- D.J. Pearson
- 1990
- IBM J. Res. Dev
Surface and interfacial energies of CoSi2 and Si films. Implications regarding formation of three-dimensional silicon-silicide structures
- K.N. Tu
- 1990
- IBM J. Res. Dev
Design of low-temperature thermal chemical vapor deposition processes
- D.B. Beach
- 1990
- IBM J. Res. Dev
Cellular automata circuits for built-in self-test
- P.D. Hortensius
- R.D. McLeod
- et al.
- 1990
- IBM J. Res. Dev
Low-temperature Si and Si:Ge epitaxy by ultrahigh-vacuum/chemical vapor deposition. Process fundamentals
- B.S. Meyerson
- 1990
- IBM J. Res. Dev
Picosecond photoelectron microscope for high-speed testing of integrated circuits
- P.G. May
- Y. Pastol
- et al.
- 1990
- IBM J. Res. Dev
Simulation of embedded memories by defective hashing
- Leendert M. Huisman
- 1990
- IBM J. Res. Dev
Surface chemistry of the WF6-based chemical vapor deposition of tungsten
- M.L. Yu
- K.Y. Ahn
- et al.
- 1990
- IBM J. Res. Dev
Picosecond photoemission probing of integrated circuits. Capabilities, limitations, and applications
- R. Clauberg
- H. Beha
- et al.
- 1990
- IBM J. Res. Dev