The analysis of complex samples by spectroscopic ellipsometry
- J. Freeouf
- 1990
- Applied Surface Science
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93 results at Applied Surface Science
Delocalization of defects: A new model for the Schottky barrier
- R. Ludeke
- A. Taleb-Ibrahimi
- et al.
- 1990
- Applied Surface Science
The Si(001)/SiO2 interface
- A. Ourmazd
- P.H. Fuoss
- et al.
- 1990
- Applied Surface Science
Chemistry and adhesion of metal-polymer interfaces
- P.S. Ho
- 1990
- Applied Surface Science
Material transformations in semiconductor and magnetic thin films
- E.E. Marinero
- 1989
- Applied Surface Science
Broadband low-reflectivity coating for semiconductor power lasers by ion-beam and PECVD deposition
- E. Marclay
- D.J. Webb
- et al.
- 1989
- Applied Surface Science
Electron spin resonance study of metal-nitride-silicon structures: Observation of Si dangling bonds with different configurations and trapping properties in silicon nitride
- D. Jousse
- Jerzy Kanicki
- et al.
- 1989
- Applied Surface Science
The physics of hot-electron degradation of Si MOSFET's: Can we understand it?
- M.V. Fischetti
- S.E. Laux
- et al.
- 1989
- Applied Surface Science
Bilayers with chromium disilicide: Chromium-vanadium
- T.G. Finstad
- O. Thomas
- et al.
- 1989
- Applied Surface Science
Coulombic and neutral electron trapping centers in SiO2
- D.A. Buchanan
- M.V. Fischetti
- et al.
- 1989
- Applied Surface Science