Gate materials consideration for submicron CMOS
- C.-Y. Ting
- B. Davari
- 1989
- Applied Surface Science
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93 results at Applied Surface Science
The nature of the dominant deep trap in amorphous silicon nitride films: Evidence for a negative correlation energy
- P. Lenahan
- D.T. Krick
- et al.
- 1989
- Applied Surface Science
CW and pulsed UV laser-induced deposition from Cr(CO)6, Mo(CO)6, and W(CO)6
- Robert L. Jackson
- George W. Tyndall
- et al.
- 1989
- Applied Surface Science
Bilayers with chromium disilicide: Chromium-vanadium
- T.G. Finstad
- O. Thomas
- et al.
- 1989
- Applied Surface Science
Some properties of CrxV1-xSi2 and CrxMo1-xSi2 thin films
- O. Thomas
- Steve Molis
- et al.
- 1989
- Applied Surface Science
The physics of hot-electron degradation of Si MOSFET's: Can we understand it?
- M.V. Fischetti
- S.E. Laux
- et al.
- 1989
- Applied Surface Science
Size dependence of chemisorptive properties based on surface cluster models: CO/Cu(100) and CO/Al(100)
- K. Hermann
- P.S. Bagus
- 1988
- Applied Surface Science
XPS oxidation study of TbFeCo films
- D.C. Miller
- E.E. Marinero
- et al.
- 1988
- Applied Surface Science
Thermal oxidation of silicon: New experimental results and models
- Eugene A. Irene
- R. Ghez
- 1987
- Applied Surface Science
Hot electrons in silicon dioxide: Ballistic to steady-state transport
- D.J. DiMaria
- M.V. Fischetti
- 1987
- Applied Surface Science