The Use of Gas Monitors to Characterize a Low-Temperature Atmospheric-Pressure Epitaxial SystemPaul D. AgnelloThomas O. Sedgwick2019JES
Composition Determination of Electrodeposited NiSn and PbSn Alloys Using Stripping Voltammetry at a Rotating Ring-Disk ElectrodeK.H. WongP.C. Andricacos2019JES
Computer Simulation of Oxygen Segregation in CZ/MCZ Silicon Crystals and Comparison with Experimental ResultsW.E. Langlois2019JES
Process Damage and Contamination Effects for Shallow Si Implanted GaAsH. BaratteA.J. Fleischmanet al.2019JES
Critical angles for channeling of boron ions implanted into single-crystal siliconChanahae ParkKevin M. Kleinet al.2019JES
Monitoring the Growth of an Oxide Film on Aluminum In Situ with the Quartz Crystal MicrobalanceOwen R. Melroy2019JES