Challenges and opportunities for high performance 32 nm CMOS technology
- J. Sleight
- I. Lauer
- et al.
- 2006
- IEDM 2006
Publications
Date
Featured collections
Popular topics
13 results at IEDM 2006
A 0.127 μm2 high performance 65 nm SOI based embedded DRAM for on-processor applications
- G. Wang
- K. Cheng
- et al.
- 2006
- IEDM 2006
Polymer self assembly in semiconductor microelectronics
- C.T. Black
- K.W. Guarini
- et al.
- 2006
- IEDM 2006
Dual-gate silicon nanowire transistors with nickel silicide contacts
- J. Appenzeller
- J. Knoch
- et al.
- 2006
- IEDM 2006
Ultra-thin phase-change bridge memory device using GeSb
- Y.C. Chen
- C.T. Rettner
- et al.
- 2006
- IEDM 2006
Fundamental power and frequency limits of deeply-scaled CMOS for RF power applications
- Jörg Scholvin
- David R. Greenberg
- et al.
- 2006
- IEDM 2006
Self-consistent and efficient electro-thermal analysis for poly/metal gate FinFETs
- Satish Kumar
- Rajiv V. Joshi
- et al.
- 2006
- IEDM 2006
Structure, design and process control for Cu bonded interconnects in 3D integrated circuits
- Kuan-Neng Chen
- Sang Hwui Lee
- et al.
- 2006
- IEDM 2006
Novel enhanced stressor with graded embedded SiGe source/drain for high performance CMOS devices
- J.-P. Han
- H. Utomo
- et al.
- 2006
- IEDM 2006
Direct silicon bonded (DSB) substrate solid phase epitaxy (SPE) integration scheme study for high performance bulk CMOS
- Haizhou Yin
- C.Y. Sung
- et al.
- 2006
- IEDM 2006