Publications

9 results at IRPS 2018

Estimating transistor channel temperature using time-resolved and time-integrated NIR emission
- - Franco Stellari
  - Alan J. Weger
  - et al.
- 2018
- IRPS 2018
Lateral profiling of HCI induced damage in ultra-scaled FinFET devices with I_d-V_d characteristics
- - Miaomiao Wang
  - Richard G. Southwick
  - et al.
- 2018
- IRPS 2018
Effect of HCI degradation on the variability of MOSFETS
- - C. Zhou
  - Keith A. Jenkins
  - et al.
- 2018
- IRPS 2018
Future on-chip interconnect metallization and electromigration
- - C. K. Hu‬
  - James Kelly
  - et al.
- 2018
- IRPS 2018
Electromigration characteristics of power grid like structures
- - Baozhen Li
  - Andrew Kim
  - et al.
- 2018
- IRPS 2018
Elapsed-time statistics of successive breakdown in the presence of variability for dielectric breakdown in BEOL/MOL/FEOL applications
- - Ernest Y. Wu
  - Andrew Kim
  - et al.
- 2018
- IRPS 2018
Reliability benefits of a metallic liner in confined PCM
- - Wanki Kim
  - S. Kim
  - et al.
- 2018
- IRPS 2018
PBTI in InGaAs MOS capacitors with Al₂O₃/HfO₂/TiN gate stacks: Interface-state generation
- - Eduard Cartier
  - Martin M. Frank
  - et al.
- 2018
- IRPS 2018
The physics of NBTI: What do we really know?
- - James H. Stathis
- 2018
- IRPS 2018