Direct Measurement of the Inversion Charge in MOSFETs: Application to Mobility Extraction in Alternative Gate Dielectrics
- A. Kerber
- E. Cartier
- et al.
- 2003
- VLSI Technology 2003
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5 results at VLSI Technology 2003
Energy Distribution of Interface Traps in High-K Gated MOSFETs
- J.-P. Han
- E.M. Vogel
- et al.
- 2003
- VLSI Technology 2003
Silicon technology - Emerging trends from a system application perspective
- Tak H. Ning
- 2003
- VLSI Technology 2003
A 0.18μm Logic-based MRAM Technology for High Performance Nonvolatile Memory Applications
- A.R. Sitaram
- D.W. Abraham
- et al.
- 2003
- VLSI Technology 2003
Integration of 1GB/sec Silicon Lateral Trench Photodetector with High-Performance CMOS
- M. Yang
- J. Schaub
- et al.
- 2003
- VLSI Technology 2003