Mechanisms of Electromigration Damage in Cu Interconnects
- C. K. Hu
- Lynne Gignac
- et al.
- 2018
- IEDM 2018
Publications
Date
Featured collections
Popular topics
19 results at IEDM 2018
Advanced Arsenic Doped Epitaxial Growth for Source Drain Extension Formation in Scaled FinFET Devices
- Shogo Mochizuki
- B. Colombeau
- et al.
- 2018
- IEDM 2018
First cryogenic electro-optic switch on silicon with high bandwidth and low power tunability
- Felix Eltes
- Jorge Barreto
- et al.
- 2018
- IEDM 2018
8-bit Precision In-Memory Multiplication with Projected Phase-Change Memory
- Iason Giannopoulos
- Abu Sebastian
- et al.
- 2018
- IEDM 2018
Future Computing Hardware for AI
- 2018
- IEDM 2018
InGaAs-on-Insulator FinFETs with Reduced Off-Current and Record Performance
- Clarissa Convertino
- C. B. Zota
- et al.
- 2018
- IEDM 2018
A Highly Efficient and Scalable Model for Crossbar Arrays with Nonlinear Selectors
- An Chen
- 2018
- IEDM 2018
System Performance: From Enterprise to AI
- Arvind Kumar
- Leland Chang
- et al.
- 2018
- IEDM 2018
Analog Computing for Deep Learning: Algorithms, Materials Architectures
- Wilfried Haensch
- 2018
- IEDM 2018
ECRAM as Scalable Synaptic Cell for High-Speed, Low-Power Neuromorphic Computing
- Jianshi Tang
- Douglas M. Bishop
- et al.
- 2018
- IEDM 2018