Highlights of ICCAD 2016
- Frank Liu
- 2017
- IEEE Design and Test
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From the Heart of Silicon Valley to the Hill Country-Highlights of ICCAD 2015
- Frank Liu
- 2016
- IEEE Design and Test
Guest Editors' Introduction: Selected Papers from IEEE VLSI Test Symposium
- Stefano Di Carlo
- Peilin Song
- et al.
- 2020
- IEEE Design and Test
Fair and Comprehensive Benchmarking of Machine Learning Processing Chips
- Geoffrey W. Burr
- SukHwan Lim
- et al.
- 2022
- IEEE Design and Test
Enabling Design Methodologies and Future Trends for Edge AI: Specialization and Codesign
- Cong Hao
- Jordan Dotzel
- et al.
- 2021
- IEEE Design and Test
Report on First and Second ACM/IEEE Workshop on Machine Learning for CAD (MLCAD)
- Marilyn Wolf
- Jorg Henkel
- et al.
- 2021
- IEEE Design and Test
Training large-scale artificial neural networks on simulated resistive crossbar arrays
- Malte J. Rasch
- Tayfun Gokmen
- et al.
- 2020
- IEEE Design and Test
A Survey on Architecture Advances Enabled by Emerging Beyond-CMOS Technologies
- An Chen
- Supriyo Datta
- et al.
- 2019
- IEEE Design and Test
A Diagnosable Network-on-Chip for FPGA Verification of Intellectual Properties
- Kyuseung Han
- Jae Jin Lee
- et al.
- 2019
- IEEE Design and Test
Test Generation Methods for Utilization Improvement of Hardware-Accelerated Simulation Platforms
- Wisam Kadry
- Dimtry Krestyashyn
- et al.
- 2017
- IEEE Design and Test