Conference paper
SRAM SER in 90, 130 and 180 NM bulk and SOI technologies
Ethan H. Cannon, Daniel D. Reinhardt, et al.
IRPS 2004
The emitted alpha particle energy distribution from solder bumps can show substantial surface emission which has a large impact on the modeled SEU rate. State-of-the art alpha-particle detectors are required to measure the low emissivity and energy distribution. © 2010 IEEE.
Ethan H. Cannon, Daniel D. Reinhardt, et al.
IRPS 2004
James R. Schwank, Marty R. Shaneyfelt, et al.
IEEE TNS
Henry H. K. Tang, Conal E. Murray, et al.
IEEE TNS
James R. Schwank, Marty R. Shaneyfelt, et al.
RADECS 2009