Strong and flexible domain typing for dynamic E-business
Yigal Hoffner, Simon Field, et al.
EDOC 2004
In this paper, we review the current status of single-event upsets caused by alpha-particles in IBM circuits and technology. While both alpha-particles and cosmic radiation can induce upsets, the alpha-particle-induced upset rate has become an increasingly important issue because alpha-particle- induced upsets are no longer limited to memory circuits. Latch circuits have become highly sensitive to alpha-particles. The alpha-particle-induced upset rate of latch circuits is one of the most critical issues for microprocessors requiring both high performance and high reliability. © Copyright 2008 by International Business Machines Corporation.
Yigal Hoffner, Simon Field, et al.
EDOC 2004
Preeti Malakar, Thomas George, et al.
SC 2012
Rajeev Gupta, Shourya Roy, et al.
ICAC 2006
Fan Jing Meng, Ying Huang, et al.
ICEBE 2007