Israel Cidon, Leonidas Georgiadis, et al.
IEEE/ACM Transactions on Networking
In this paper, we review the current status of single-event upsets caused by alpha-particles in IBM circuits and technology. While both alpha-particles and cosmic radiation can induce upsets, the alpha-particle-induced upset rate has become an increasingly important issue because alpha-particle- induced upsets are no longer limited to memory circuits. Latch circuits have become highly sensitive to alpha-particles. The alpha-particle-induced upset rate of latch circuits is one of the most critical issues for microprocessors requiring both high performance and high reliability. © Copyright 2008 by International Business Machines Corporation.
Israel Cidon, Leonidas Georgiadis, et al.
IEEE/ACM Transactions on Networking
Qing Li, Zhigang Deng, et al.
IEEE T-MI
Joel L. Wolf, Mark S. Squillante, et al.
IEEE Transactions on Knowledge and Data Engineering
M.J. Slattery, Joan L. Mitchell
IBM J. Res. Dev