J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
To meet the European Union Restriction of Hazardous Substances requirements and the continuing demand for lower costs, finer pitch, and high-reliability flip-chip packaging structures, considerable work is going on in the electronic industry to develop lead-free solutions for flip-chip technology. In this paper various solder-bumping technologies developed for flip-chip applications are reviewed with an emphasis on a new wafer-bumping technology called C NP (Controlled-Collapse-Chip-Connect New Process). Several inherent advantages of C NP technology are discussed over other technologies. This paper will also discuss the recent development and implementation of lead-free C interconnections for 300 mm wafers demonstrated at IBM. In addition, some metallurgical considerations associated with C NP technology are discussed.
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
J.Z. Sun
Journal of Applied Physics
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics
Surendra B. Anantharaman, Joachim Kohlbrecher, et al.
MRS Fall Meeting 2020