Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
Selective protection of the porosity can be implemented in porous materials processing by using an organic polymer fill. This strategy is employed to protect ultralow-k (ULK) materials during patterning of 250-nm lines and spaces. Structures with significantly less sidewall and trench bottom damage are obtained, proving the potential of this novel approach in materials science. Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
Kenneth R. Carter, Robert D. Miller, et al.
Macromolecules
Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT
Andreas C. Cangellaris, Karen M. Coperich, et al.
EMC 2001