J.M.E. Harper, C. Cabral Jr., et al.
Journal of Applied Physics
Stripping voltammetry combined with ring-disk electrodes can be used for the determination of composition and thickness of electrodeposited alloys. Applications of this technique to several systems of interest in the electronics industry are described. These include electrodeposited NiFe, CoFe, NiSn, PbSn, NiCu, and CoCu alloys. Extensions of the method to depth profiling as well as in-situ measurement of individual reaction rates are discussed.
J.M.E. Harper, C. Cabral Jr., et al.
Journal of Applied Physics
H. Barratte, G. Scilla, et al.
ECS Meeting 1989
Y. Martin, D.W. Abraham, et al.
ECS Meeting 1989
J. Horkans
JES