Conference paper
Multi-line crosstalk and common-mode noise analysis
A. Deutsch, H. Smith, et al.
IEEE Topical Meeting EPEPS 2000
This paper compares the major classes of chip-to-chip and on-chips interconnections used in high-performance computers and communication systems. Measurement of dielectric loss is shown and the attenuation is compared for printed-circuit-board, glass-ceramic, thin-film, and on-chip wiring. Simulation results are shown with representative driver and receiver circuits, guidelines are formulated for when losses are significant, and predictions are made for the sustainable brandwidths on useful wiring lengths.
A. Deutsch, H. Smith, et al.
IEEE Topical Meeting EPEPS 2000
A. Deutsch, H. Smith, et al.
IEEE Topical Meeting EPEPS 1997
P. Restle, A. Deutsch
VLSI Circuits 1998
A. Deutsch, H. Smith, et al.
IEEE Topical Meeting EPEPS 1997