Invited talkScaling opportunities for Gate-All-Around and beyond: A patterning perspectiveIndira Seshadri, Eric Miller, et al.IEDM 2023
Workshop paperWARDEN: Warranting Robustness Against Deception in Next-Generation SystemsHazar Yueksel, Ramon Bertran, et al.MLSys 2020
TalkFerroelectric Synapses in Neuromorphic Circuits—Integration of Perovskite- and Hafnia-Based CrossbarsLaura Bégon-Lours, Mattia Halter, et al.MRS Spring Meeting 2023
TalkMulti-Cycle Interconnect Synthesis (MCIS) : (data) register tree constructionYing Zhou, Gi-Joon Nam, et al.DAC 2023
