Conference paperBias-stress-induced stretched-exponential time dependence of charge injection and trapping in amorphous silicon thin-film transistorsFrank R. Libsch, Jerzy KanickiSSDM 1992
Conference paperParamagnetic nitrogen defects in silicon nitrideW.L. Warren, Jerzy Kanicki, et al.MRS Proceedings 1992
PaperEvidence for a negative electron-electron correlation energy in the dominant deep trapping center in silicon nitride filmsSean E. Curry, P. Lenahan, et al.Applied Physics Letters
Conference paperNitrogen dangling bonds in hydrogenated amorphous silicon nitride thin filmsJerzy Kanicki, W.L. Warren, et al.SSDM 1992