PaperVoltage measurement in the scanning electron microscopeO.C. Wells, C.G. BremerJournal of Physics E: Scientific Instruments
PaperCoating, mechanical constraints, and pressure effects on electromigrationN.G. Ainslie, F.M. D'Heurle, et al.Applied Physics Letters
PaperGrazing-incidence x-ray diffraction characterization of Co-Pt magneto-optical thin filmsT.C. Huang, R.J. Savoy, et al.Applied Physics Letters
Conference paperExplanation of the high resolution backscattered electron image in the scanning electron microscope by the twin-population theory - a historical reviewO.C. WellsMSA Annual Meeting 1993
