Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
A simple u.v. curing process is described that renders micron sized images in AZ resists resistant to flow when heated to temperatures as high as 210° C. The u.v. treatment prevents the image flow problems usually encountered in reactive ion etching processes. © 1981, The Electrochemical Society, Inc. All rights reserved.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
R.D. Murphy, R.O. Watts
Journal of Low Temperature Physics
I. Morgenstern, K.A. Müller, et al.
Physica B: Physics of Condensed Matter
R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids